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Pulse Laser Diode Test System with optional Integrating Sphere 2520/KIT1: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test
Channel 1 and 2 Max I - 6A
Measurement Resolution (Current / Voltage) - 10fA / 100nV
high temperatures
safety test leads
AFG31102 C3 Calibration service 3 years SE Pulse Laser Diode Test SystemProvides traceable or functional verification events whichever are applicable to the Product. Cals are at Tektronix recommended interval during the coverage period. Cal coverage includes the Manufactures Cal + 2 For more information: Tektronix
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